Daniel B Limbrick

Associate Professor

Daniel B Limbrick
Google Scholar

College of Engineering

Electrical & Computer Engineering

B.S.Electrical Engineering / Texas A&M University
M.S.Electrical Engineering / Vanderbilt University
Ph.D.Electrical Engineering / Vanderbilt University


Dr. Limbrick is an Associate Professor in the Electrical and Computer Engineering Department at NC A&T. As a postdoctoral fellow at the Georgia Institute of Technology, he researched methods to improve routing congestion in monolithic 3D integrated circuits with Dr. Sung Kyu Lim. As a doctoral student, Dr. Limbrick was a member of the Radiation Effects and Reliability (RER) Group and the Security And Fault Tolerance (SAF-T) Research Group, where his research was conducted under the advisement of Dr. William H. Robinson. He received a BS degree in Electrical Engineering at Texas A&M and his MS degree and Ph.D. degree at Vanderbilt University.

Research Interests

Dr. Daniel B. Limbrick leads the Automated Design for Emerging Processing Technologies (ADEPT) Laboratory at NC A&T where he researches ways to improve the reliability and scalability of integrated circuits through logic & physical synthesis. His research interests include electronic design automation, post-CMOS technologies, computer architecture, lab-on-a-chip, and the reliability of microelectronics.

External URL


Recent Publications

  • Nihaar Mahatme, Indranil Chatterjee, Akash Patki, Daniel Limbrick, Bharat Bhuva, Ronald Schrimpf, William Robinson (2013). (An efficient technique to select logic nodes for single event transient pulse-width reduction). (1) 53, pp. 114 - 117. Microelectronics Reliability.
  • Daniel Limbrick (2013). (Reliability-Aware Synthesis of Combinational Logic With Minimal Performance Penalty). (4) 60, pp. 2776 - 2781. IEEE Transactions on Nuclear Science.
  • D. Black, W. Robinson, I. Wilcox, Daniel Limbrick, J. Black (2015). (Modeling of Single Event Transients With Dual Double-Exponential Current Sources: Implications for Logic Cell Characterization). (4) 62, pp. 1540-1549. IEEE Transactions on Nuclear Science.
  • Bradley Kiddie, William Robinson, Daniel Limbrick (2015). (Single-Event Multiple-Transient Characterization and Mitigation via Alternative Standard Cell Placement Methods). (4) 20, pp. 60:1 - 60:22. ACM Trans. Des. Autom. Electron. Syst..
  • Ahmed Yiwere, Ebenezer Tachie-Menson, Daniel Limbrick (2019). (Evaluation of Discrete-Event Simulators and Satisfiability Solvers in the Calculation of Soft Error Propagation). (1) 5, pp. 8-17. Transactions on Techniques in STEM Education.