Daniel B. Limbrick

TitleAssistant Professor

DepartmentElectrical and Computer Engineering

Phone336-285-3310

Fax336-334-7716

Emaildblimbri@ncat.edu, daniel.limbrick@ncat.edu

Websitehttp://DanielLimbrick.com

OfficeMcNair Hall
Room: 523

1601 East Market Street
Greensboro, NC 27411

Daniel B. Limbrick

Education

Ph D: Electrical Engineering, Vanderbilt University, 2012

MS: Electrical Engineering, Vanderbilt University, 2009

BS: Electrical Engineering, Texas A&M University, 2007


Research Interests

Dr. Daniel B. Limbrick leads the Automated Design for Emerging Processing Technologies (ADEPT) Laboratory at NC A&T where he researches ways to improve the reliability and scalability of integrated circuits through logic & physical synthesis. His research interests include electronic design automation, post-CMOS technologies, computer architecture, lab-on-a-chip, and the reliability of microelectronics.


Recent Publications

Kiddie,  Bradley  Robinson,  William  Limbrick,  Daniel  ( 2015).  Single-Event Multiple-Transient Characterization and Mitigation via Alternative Standard Cell Placement Methods.  ( 4,  20,  pp. 60:1 - 60:22).   ACM Trans. Des. Autom. Electron. Syst..

Black,  D.  Robinson,  W.  Wilcox,  I.  Limbrick,  Daniel  Black,  J.  ( 2015).  Modeling of Single Event Transients With Dual Double-Exponential Current Sources: Implications for Logic Cell Characterization.  ( 4,  62,  pp. 1540-1549).   IEEE Transactions on Nuclear Science.

Mahatme,  Nihaar  Chatterjee,  Indranil  Patki,  Akash  Limbrick,  Daniel  Bhuva,  Bharat  Schrimpf,  Ronald  Robinson,  William  ( 2013).  An efficient technique to select logic nodes for single event transient pulse-width reduction.  ( 1,  53,  pp. 114 - 117).   Microelectronics Reliability.

Limbrick,  Daniel  ( 2013).  Reliability-Aware Synthesis of Combinational Logic With Minimal Performance Penalty.  ( 4,  60,  pp. 2776 - 2781).   IEEE Transactions on Nuclear Science.